SanDisk TP70G76AWV02008N 96-Layer QLC 3D NAND Memory Floorplan Analysis

This report presents a Memory Floorplan Analysis of the SanDisk FSPO_1.33T found inside SanDisk TP70G76AWV02008N. The TP70G76AWV02008N was extracted from the X002IP5MTP.

This report contains the following detailed information:

• Selected teardown photographs, package photographs, package X-rays, die markings, and die photographs
• SEM cross-sectional micrographs of the general structure of the die dielectric materials, major features, and transistors
• Plan-view SEM micrograph of the die delayered to the WL and BL layers
• Measurements of vertical and horizontal dimensions of major microstructural features
• Plan-view optical micrograph of the die delayered to the polysilicon layer
• Identification of major functional blocks on a polysilicon die photograph
• Table of functional block sizes and percentage die utilization
• High-resolution top metal and polysilicon die photographs delivered in CircuitVision
• Cost of die and tested packaged die, based on the manufacturing cost analysis of the observed process