Samsung Exynos 8895 Digital Functional Analysis Report

This report presents a Digital Functional Analysis of the Samsung S5E8895A01 die found inside Samsung Exynos 8895
PoP component. The Exynos 8895 component was extracted from a Samsung Galaxy S8 smartphone with the model number
SM-G950N.

This report contains the following detailed information:

• Selected teardown photographs, package photographs, package X-rays, die markings, and die photographs
• Scanning electron microscopy (SEM) plan-view micrographs showing the layout of the die at the levels including fin/STI, gate, contacts, and minimum pitch metals
• Measurements of horizontal dimensions of some of the major layout features, particularly the pitch and track height of standard cells
• Plan-view optical micrograph of the die delayered to polysilicon
• Identification of major functional blocks on a polysilicon die photograph
• Table of functional block sizes and percentage die utilization
• High-resolution top metal and polysilicon die photographs delivered in the ICWorks Browser
• Cost of die and tested packaged die, based on the manufacturing cost analysis of the observed process